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MBE LEED

The MBE-LEED based on a conventional LEED system enables the preparation of layer systems under UHV conditions and LEED measurement to be carried out simultaneously. Thus, it becomes possible to observe and document the growth behavior of molecular layers in situ.

It is possible to adjust all relevant preparation parameters

  • substrate temperature
  • deposition rate
  • amount of deposition

while LEED measuring is carried out.

MBE LEED optic DCNQI/Ag(110) two coverages

Fig. 1: MBE-LEED-optic with the three crucibles visible

Fig. 2: Composition of two LEED images selected from an "LEED film"

In this way, it is possible to record complete phase diagrams representing the development of a layer system.

Special Knudsen cells:

  • Compensation of the magnetic field
  • Low thermal crosstalk
  • Minimized light emission
  • No soiling of LEED optics
  • Easy exchange of the substance crucibles

Owing to the geometrical adaptation, the crucibles obscure the usable viewing area only to a very small degree.

Elektonic MBE-LEED
Fig 3: MBE-LEED power supply

Further information:

Real-time monitoring of phase transitions of vacuum deposited organic films by molecular beam deposition LEED C. Seidel, J. Poppensieker, H. Fuchs Surface Science, vol.408, no.1-3, (1998), pp.223-31

Growing process and compressed phase of DMe-DCNQI on Ag(110) observed in the monolayer regime by LEED, XPS and STM C. Seidel, H. Kopf and H. Fuchs Rhysical Review. B Vol. 60 Nr. 20 (1999) 14341

Oriented growth of DMe-PTCDI on Ag(110) An LEED, XPS, AFM and STM characterisation C. Seidel, A. H. Schafer, H. Fuchs, Surface Science 459 (2000) 310-322





kentax UHV equipment, www.kentax.de, info@kentax.de,
Tel. ++49(0)5137 9078 84, Fax: ++49(0)5137 9078 86