Projection Pattern (For capacity reasons we stop the production of samples. Only the goods in stock are sold off.)
Test patterns (Fischer sample) for scanning probe microscopy. The projection patterns can be used for resolution control (in a range from 220 nm to 990 nm) and lateral calibration.
Monolayers of hexagonal closely packed latex spheres, deposited on suitable substrates, are used as a mask for physical vapour deposition.
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Fig 1: Fischer samples at different production stages:
- Monolayer (left side) and bilayer (right side)of 439 nm spheres adsorbed on glass
- Metal coating and separation of the monolayer areas
- Displacement of the latex spheres AFM high contrast 15 nm
- Phase contrast image made in the AFM tapping mode
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Typical applications:
- NSOM/SNOM (Near-field Scanning Optical Microscopes)
- AFM (Atomic Force Microscopes)
- SEM/TEM (Scanning Electron Microscopes / Transmission Electron Microscopes)
- Light microscopes
Specifications:
- Substrates: Glass (0.15 mm thick)
- Material for vapour deposition: Al, Au, Cr
- Diameter of the latex spheres: usually 505 nm
- Al standard sample (sample size about 7 mm x 4 mm)
Projection Pattern in available stock
Delivery: Approx. 2 weeks ARO.
AL 230
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Availability in stock: 20
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AL 356
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Availability in stock: 14
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AL 453
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Availability in stock: 19
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AL 510
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Availability in stock: 5
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AL 990
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Availability in stock: 0
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AL 1238
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Availability in stock: 10
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AU 356
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Availability in stock: 7
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AU 453
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Availability in stock: 9
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AU 505
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Availability in stock: 0
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AU 990
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Availability in stock: 20
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Chrom 230
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Availability in stock: 3
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Chrom 453
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Availability in stock: 2
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